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measurement & testing equipment

  • 3D-Inline SPI System, Koh Young
  • 3D-Inline AOI System, Koh Young
  • Boundary-Scan-Test (Göpel and JTAG)
  • In-circuit test, flying probe test system SPEA 4060 multifunctional test, dynamic, digital, cluster test, Boundary-Scan test, on board-programming


Modern and high flexible measure and test equipment lead to an increase of test coverage and reduction of fixed costs.